Books

3 results found
Title Authors Description OpenBook ID
2001 6th International Symposium on Plasma- and Process-Induced Damage 2001 6th International Symposium on Plasma- and Process-Induced Damage Manfred Engelhardt International Symposium on Plasma Process-Induced Damage (6th 2001 Monterey, Calif.) OL13697262W
2000 5th International Symposium on Plasma Process-Induced Damage 2000 5th International Symposium on Plasma Process-Induced Damage Mitsumasa Koyanagi International Symposium on Plasma Process-Induced Damage (5th 2000 Santa Clara, Calif.) OL13697264W
Gate dielectric integrity Gate dielectric integrity D. C. Gupta xi, 169 p. : 23 cm OL19473359W