Books
1 results found| Title | Authors | Description | OpenBook ID | |
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Semiconductor measurement technology | Kenney, James M., Institute for Applied Technology (U.S.). Electronic Technology Division | Abstract: The permanent damage Induced by nuclear radiation In silicon Schottky-barrler X-band microwave mixer diodes was assessed by subjecting separate groups of diodes to 60Co gamma rays and fast … | OL17306542W |