Books
2 results foundTitle | Authors | Description | OpenBook ID | |
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Transmission Electron Microscopy and Diffractometry of Materials | Brent Fultz | This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new te… | OL19907784W |
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X-Ray Multiple-Wave Diffraction | Shih-Lin Chang | This comprehensive text describes the fundamentals of X-ray multiple-wave interaction in crystals and its applications in condensed matter physics and crystallography. It covers current theoretical a… | OL19911928W |