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Advanced Materials Modelling for Structures
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Holm Altenbach |
This volume presents the major outcome of the IUTAM symposium on “Advanced Materials Modeling for Structures”. It discusses advances in high temperature materials research, and also to provides a dis… |
OL19823971W |
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Computational Electromagnetics and Model-Based Inversion
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Harold A. Sabbagh |
Computational Electromagnetics and Model-Based Inversion: A Modern Paradigm for Eddy Current Nondestructive Evaluation describes the natural marriage of the computer to eddy-current NDE. Three distin… |
OL19836140W |
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Low-Pressure Synthetic Diamond
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Bernhard Dischler |
The advent of low-pressure synthesis techniques for the chemical vapour deposition (CVD) of diamond has opened up a new and fascinating field of research and development. The preparation of diamond i… |
OL19884795W |
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Mathematical Techniques in Chrystallography and Materials Science
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Edward Prince |
Crystallographers have to apply many mathematical methods in their daily work. "Mathematical Techniques in Crystallography and Materials Science" brings together common and less familiar mathematical… |
OL19886373W |
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Melt Rheology and its Applications in the Plastics Industry
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John M. Dealy |
This is the second edition of Melt Rheology and its Role in Plastics Processing, although the title has changed to reflect its broadened scope. Advances in the recent years in rheometer technology an… |
OL19887369W |
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New Procedures in Nondestructive Testing
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P. Höller |
During recent years an increasing amount of research has been conducted to develop methods and procedures for improving inter pretation in nondestructive testing. This research covers appro priate … |
OL19890690W |
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Planewaves, Pseudopotentials and the LAPW Method
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David J. Singh |
Over the past decade the world's technological and industrial base has become increasingly dependent on advanced materials. There is every indication that this trend will accelerate and that progress… |
OL19895172W |
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Transmission Electron Microscopy and Diffractometry of Materials
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Brent Fultz |
This textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to b… |
OL19907783W |